2024.1.15—Failure Analysis—转载
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Failure Analysis
Failure analysis is an indispensable part of production control required in manufacturing semiconductor materials. Depending on the material and application, failure analysis can be divided into electrical, chemical, and mechanical tests, to investigate the root cause of a product or material failure.
SEM/TEM-based Solutions
Quantitative EDS in STEM combined with individual sample preparation on the component level (FIB) provides the means to identify and study defects of the internal structure of semiconductor devices.